New Methodology for Accurate Determination of Molecular Co-localization at the Nanoscale.

A new methodology using nanoparticle projectile secondary ion mass spectrometry was developed to identify statistically significant co-localization of tagged proteins versus random aggregations at the nanoscale. The custom instrument was run in the unique event-by-event bombardment detection mode with 1040 keV Au28008+ individual projectiles each probing an area with a diameter of ∼20 nm. In a model experiment, antibodies tagged with fluorine, iodine, and bromine were attached on a silicon wafer in a 1:1:1 ratio. To determine whether the three different antibodies were homogeneously distributed at the nanoscale or if there were fluctuations due to the slightly different physical properties of the tags, a "co-localization factor" was introduced. It is shown for the first time that the differences in the hydrophobicity of the tags induced fluctuations, causing differential attachment of the tags at the nanoscale. When tags with the same physical and chemical properties were used, the analysis of co-localization factors shows that the attachment became random.

Mass Spectrometry of Nanoparticles is Different.

Secondary ion mass spectrometry, SIMS, is a method of choice for the characterization of nanoparticles, NPs. For NPs with large surface-to-volume ratios, heterogeneity is a concern. Assays should thus be on individual nano-objects rather than an ensemble of NPs; however, this may be difficult or impossible. This limitation can be side-stepped by probing a large number of dispersed NPs one-by-one and recording the emission from each NP separately. A large collection of NPs will likely contain subsets of like-NPs. The experimental approach is to disperse the NPs and hit an individual NP with a single massive cluster (e.g., C-60, Au-400). At impact energies of ~1 keV/atom, they generate notable secondary ion (SI) emission. Examination of small NPs (≤20 nm in diameter) shows that the SI emission is size-dependent and impacts are not all equivalent. Accurate identification of the type of impact is key for qualitative assays of core or outer shell composition. For quantitative assays, the concept of effective impacts is introduced. Selection of co-emitted ejecta combined with rejection (anticoincidence) of substrate ions allows refining chemical information within the projectile interaction volume. Last, to maximize the SI signal, small NPs (≤5 nm in diameter) can be examined in the transmission mode where the SI yields are enhanced ~10-fold over those in the (conventional) reflection direction. Future endeavors should focus on schemes acquiring SIs, electrons, and photons concurrently.

SIMS instrumentation and methodology for mapping of co-localized molecules.

We describe an innovative mode for localizing surface molecules. In this methodology, individual C60 impacts at 50 keV are localized using an electron emission microscope, EEM, synchronized with a time-of-flight mass spectrometer for the detection of the concurrently emitted secondary ions. The instrumentation and methodologies for generating ion maps are presented. The performance of the localization scheme depends on the characteristics of the electron emission, those of the EEM and of the software solutions for image analysis. Using 50 keV C60 projectiles, analyte specific maps and maps of co-emitted species have been obtained. The individual impact sites were localized within 1-2 µm. A distinctive feature of recording individual impacts is the ability to identify co-emitted ions which originate from molecules co-located within ~10 nm.

Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts.

The use of large cluster primary ions (e.g. C60, Au400) in secondary ion mass spectrometry has become prevalent in recent years due to their enhanced emission of secondary ions, in particular, molecular ions (MW ≤ 1500 Da). The co-emission of electrons with SIs was investigated per projectile impact. It has been found that SI and electrons yields increased with increasing projectile energy and size. The use of the emitted electrons from impacts of C60 for localization has been demonstrated for cholesterol deposited on a copper grid. The instrumentation, methodologies, and results from these experiments are presented.

On the Surface Mapping using Individual Cluster Impacts.

This paper describes the advantages of using single impacts of large cluster projectiles (e.g. C(60) and Au(400)) for surface mapping and characterization. The analysis of co-emitted time-resolved photon spectra, electron distributions and characteristic secondary ions shows that they can be used as surface fingerprints for target composition, morphology and structure. Photon, electron and secondary ion emission increases with the projectile cluster size and energy. The observed, high abundant secondary ion emission makes cluster projectiles good candidates for surface mapping of atomic and fragment ions (e.g., yield >1 per nominal mass) and molecular ions (e.g., few tens of percent in the 500 < m/z < 1500 range).

Photon, Electron and Secondary Ion Emission from Single C(60) keV Impacts.

This paper presents the first observation of coincidental emission of photons, electrons and secondary ions from individual C(60) keV impacts. An increase in photon, electron and secondary ion yields is observed as a function of C(60) projectile energy. The effect of target structure/composition on photon and electron emissions at the nanometer level is shown for a CsI target. The time-resolved photon emission may be characterized by a fast component emission in the UV-Vis range with a short decay time, while the electron and secondary ion emission follow a Poisson distribution.